Petrik, Péter (1999) Characterization of polysilicon thin films using in situ and ex situ spectroscopic ellipsometry. PhD thesis, BME ; MTA MFA.
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Supervisor name: Gyulai, József
DOI identifier
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| Item Type: | Thesis (PhD) |
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| Subjects: | Q Science / természettudomány > QC Physics / fizika |
| Depositing User: | Erika Bilicsi |
| Date Deposited: | 23 Aug 2013 09:49 |
| Last Modified: | 22 Jan 2014 08:35 |
| URI: | http://real-phd.mtak.hu/id/eprint/20 |
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